Japanese Journal of Applied Physics · 2005 · 20 citations · 20 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials CharacterizationNanomaterialsNanotechnologyAtomic Force MicroscopyCarbon NanomaterialsCarbon NanotubesElectrical CharacterizationNanotubesScanning Probe MicroscopyCarbon Nanotube CharacterizationCarbon Nanotube Electrical ConductivityCarbon Nanotube Thin FilmsConductivityElectrical Conductivity MeasurementsElectrical Conductivity Of NanotubesMetal Thin FilmsNanotube Characterization
Electrical characteristics of bare and metal-coated carbon nanotube (CNT) tips were investigated with an independently driven four-tip scanning tunneling microscope (STM). The CNT was glued on a W tip apex and wholly coated ex situ by metal thin layers. The resistance between the CNT-tip end and the W supporting tip scattered very widely from ca. 50 kΩ to infinity for the bare tips, while coating the tip with a 6-nm-thick PtIr film stably reduced the resistance to less than approximately 10 kΩ. The W coating was also effective for stabilizing the resistance, although they showed slightly larger resistance ( ca. 50 kΩ). The metal-coated tips kept their low resistance and flexibility even after 100 repeated contacts to an object for conductivity measurements. They are expected to be useful for nanometer-scale transport measurements with multiprobe STM as well as for conventional single-tip STM.
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