Publication | Closed Access
Structure and annealing properties of silicon carbide thin layers formed by implantation of carbon ions in silicon
48
Citations
9
References
1981
Year
Materials EngineeringMaterials ScienceEngineeringNanoelectronicsApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorMicroelectronicsCarbon IonsChemical Vapor DepositionCarbide
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