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Electron escape from InAs quantum dots
152
Citations
29
References
1999
Year
Quantum ScienceElectron EscapeEngineeringVertical Electric FieldPhysicsTunneling MicroscopyNanoelectronicsQuantum DeviceApplied PhysicsQuantum DotsSemiconductor MaterialDirect TunnelingCharge Carrier Transport
We identify fundamental mechanisms of electron escape from self-organized InAs quantum dots (QD's) in a vertical electric field by time-resolved capacitance spectroscopy. Direct tunneling and a thermally activated escape process are observed. The QD electron ground and first-excited states are concluded to be located \ensuremath{\sim}190 and \ensuremath{\sim}96 meV below the GaAs matrix conduction band, respectively. Our experimental results and their interpretation are in good agreement with eight-band $\mathbf{k}\ensuremath{\cdot}\mathbf{p}$ calculations and demonstrate the importance of tunnel processes.
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