Publication | Closed Access
Electrical characterization of ONO triple dielectric in SONOS nonvolatile memory devices
27
Citations
10
References
2001
Year
Non-volatile MemoryElectrical EngineeringEngineeringApplied PhysicsElectrical CharacterizationMemory DeviceSemiconductor MemoryMicroelectronicsOno Triple DielectricElectrical Insulation
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