Charge distribution of Xe ions as a result of multiple photoionisation of Xe atoms between 4.1 and 8.0 keV

Abstract

The charge distributions of Xe ions as a result of photoionisation have been studied experimentally and theoretically. The initial vacancies are produced by 4.1-8.0 keV synchrotron orbital radiation and the charge distribution of ions was measured with a time-of-flight mass spectrometer at various photon energies. The theoretical estimation of the charge distribution was made by the use of the Monte Carlo simulation. The calculated charge distributions as a function of incident photon energy are in good agreement with the measured results.