IEEE Transactions on Magnetics · 1987 · 44 citations · 14 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyElectric CircuitsHigh-frequency Semiconductor DevicesIntegrated Circuit DesignSuperconducting MaterialsCapacitive CouplingFabricationJosephson JunctionsJosephson TunnelingJunction Engineering
We have developed and are regularly practicing a seven mask-level Josephson integrated circuit fabrication process tailored to dc SQUID requirements and intended for SQUID studies and other scientific applications of Josephson technology. The process incorporates low capacitance Nb/Nb <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> O <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</inf> /PbAuIn edge junctions, PdAu shunt resistors, and a wiring pitch of 5 μm for the SQUID input coil level (which is PbAuIn). The junctions can be made as small as 2μm by 0.3μm, with a capacitance (including parasitics) of ∼0.14 pF. This process yields stable and reliable junctions and integrated circuits.
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dc SQUID: Noise and optimization
Claudia D. Tesche, John Clarke · Journal of Low Temperature Physics · 1977 · 682 citations · Full text
Low-frequency noise in low 1/<i>f</i> noise dc SQUID’s
V. Foglietti, W. J. Gallagher, M. B. Ketchen et al. · Applied Physics Letters · 1986 · 104 citations
DC SQUIDs 1980: The state of the art
M. B. Ketchen · IEEE Transactions on Magnetics · 1981 · 100 citations