Optical parameters of epitaxial GaN thin film on Si substrate from the reflection spectrum

Optical Properties and Electronic Structure of Amorphous Germanium

J. Tauc, R. Grigorovici, A. Vancu · physica status solidi (b) · 1966 · 10.4K citations

Materials Science, Optical Materials, Engineering +15

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

Photonics, Photometry, Optical Materials +15

Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

Optical Materials, Engineering, Optic Design +17

Ellipsometry and Polarized Light

J.P.G. Farr · Surface Technology · 1978 · 1.1K citations

Photometry, Optical Materials, Engineering +3

Optical constants of rf sputtered hydrogenated amorphous Si

E. C. Freeman, William Paul · Physical review. B, Condensed matter · 1979 · 333 citations

Optical Materials, Engineering, Absorption Spectroscopy +17