Publication | Closed Access
The influence of bombardment conditions upon the sputtering and secondary ion yields of silicon
81
Citations
30
References
1981
Year
Ion ImplantationEngineeringPhysicsBombardment ConditionsSecondary Ion YieldsApplied PhysicsAtomic PhysicsIon BeamSemiconductor Device FabricationIon EmissionSilicon On InsulatorMicroelectronics
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