Physical characterization of thin‐film solar cells

Abstract

Abstract The principal techniques used in the physical characterization of thin‐film solar cells and materials are reviewed, these being scanning probe microscopy (SPM), X‐ray diffraction (XRD), spectroscopic ellipsometry, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), secondary‐ion mass spectrometry (SIMS), X‐ray photoelectron spectroscopy (XPS), photoluminescence and time‐resolved photoluminescence (TRPL), electron‐beam‐induced current (EBIC) and light‐beam‐induced current (LBIC). For each method the particular applicability to thin‐film solar cells is highlighted. Examples of the use of each are given, these being drawn from the chalcopyrite, CdTe, Si and III–V materials systems. Copyright © 2004 John Wiley & Sons, Ltd.