Concepedia

Concept

thin-film characterization

Parents

220

Publications

25K

Citations

1K

Authors

341

Institutions

About

Thin-film characterization is the systematic investigation of the physical, chemical, structural, electrical, optical, and mechanical properties of materials deposited as thin layers, typically ranging from nanometer to micrometer thickness. This methodological approach is essential for understanding material behavior at reduced dimensions and optimizing performance for diverse scientific and technological applications.

Top Authors

Rankings shown are based on concept H-Index.

RN

National Renewable Energy Laboratory

National Renewable Energy Laboratory

KR

National Renewable Energy Laboratory

TM

National Institute of Advanced Industrial Science and Technology

MA

UNSW Sydney

Top Institutions

Rankings shown are based on concept H-Index.

UNSW Sydney

Sydney, Australia

Colorado State University

Fort Collins, United States