X-Ray Interferometry with Microelectronvolt Resolution

Abstract

We demonstrate an interferometer for hard x rays with two back-reflecting sapphire crystal mirrors--a prototype x-ray Fabry-Pérot interferometer. A finesse of 15 and 0.76 mu eV broad Fabry-Pérot transmission resonances are measured by the time response of the interferometer. Interference patterns are observed directly in spectral dependences of reflectivity.