Publication | Closed Access
Characterization of single-crystalline In2O3 films deposited on Y-stabilized ZrO2 (100) substrates by MOCVD
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Citations
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References
2010
Year
Materials ScienceSingle-crystalline In2o3 FilmsEngineeringOxide ElectronicsSurface ScienceApplied PhysicsGallium OxideY-stabilized Zro2Thin Film Process TechnologyThin FilmsChemical Vapor DepositionThin Film Processing
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