Quantification of SOFC anode microstructure based on dual beam FIB-SEM technique - Concepedia

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Quantification of SOFC anode microstructure based on dual beam FIB-SEM technique

409

Citations

24

References

2009

Year

Hiroshi Iwai, Naoki Shikazono, Toshiaki Matsui, Hisanori Teshima, Masashi Kishimoto, Ryo Kishida, Daisuke Hayashi, Katsuhisa Matsuzaki, Daisuke Kanno, Motohiro Saito,

Journal of Power Sources

Materials ScienceMaterials EngineeringSofc Anode MicrostructureEngineeringMicrofabricationApplied PhysicsMicroelectronicsMicrostructure

References

	Year	Citations

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