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Estimation of microstructural properties from synchrotron X-ray microtomography and determination of the REV in paper materials

Materials ScienceMicrostructural PropertiesX-ray SpectroscopyEngineeringMicroscopyMaterials CharacterizationApplied PhysicsSynchrotron X-ray MicrotomographyX-ray DiffractionPaper MaterialsMicroanalysisMicrostructureX-ray Imaging