X-ray line broadening study of splat cooled aluminium and aluminium-tin and aluminium-nickel solid solutions

Abstract

Measurements of broadening of X-ray diffraction peaks were made for splat cooled pure aluminium samples, and some splat cooled aluminium-tin and aluminium-nickel solid solutions. A Fourier analysis was made of the shape of the peaks and the instrumental broadening was corrected by using the peaks of annealed material. It was found that in all examined samples the major source of broadening are strains. In Al-Sn and Al-Ni solid solutions, obtained by quenching from the melt, microstrains increased with increasing concentration of solute atoms. There are indications that strains are smaller in larger coherent regions.