Computer-based highly sensitive electron-wave interferometry

Abstract

For subfringe measurement in electron-wave interferometry, the Fourier transform method of fringe-pattern analysis is applied to electron holographic interferometry. Experimental results of magnetic-field measurement are presented to demonstrate subfringe detection with a much higher sensitivity than h/e = 4.1 × 10−15 (Wb/fringe), the limit set by the Aharonov-Bohm effect.