X-ray photoelectron spectroscopy and atomic force microscopy characterization of the effects of etching ZnxCd1−xTe surfaces - Concepedia

Concepedia

Publication | Closed Access

X-ray photoelectron spectroscopy and atomic force microscopy characterization of the effects of etching ZnxCd1−xTe surfaces

16

Citations

25

References

1993

Year

M. A. George, M. Azoulay, H.N. Jayatirtha, A. Bürger, W. E. Collins, E. Silberman

Surface Science

Materials ScienceSurface CharacterizationEngineeringElectron-beam LithographySurface AnalysisSurface ScienceApplied PhysicsX-ray Photoelectron SpectroscopySurface EngineeringPlasma EtchingZnxcd1−xte Surfaces

References

	Year	Citations

Page 1