Electron Diffraction Contrast from Three Parallel Overlapping Stacking Faults

Abstract

Abstract The electron diffraction contrast to be expected from three parallel overlapping intrinsic stacking faults has been computed. It is shown that faint fringe contrast always arises from this configuration, even in the limiting case when the faults lie on neighbouring slip planes. This is contrary to previous predictions. Moreover, by comparison with experimental images, it is shown that the faint fringe contrast is generally detectable and that the actual spacing of the three faulted planes may be deduced. The effect of dislocation strain‐fields on this faint contrast is discussed and some results for the contrast from two parallel intrinsic stacking faults are presented.