Detection of Foreign Atom Sites by Their X-Ray Fluorescence Scattering

B. W. Batterman

Physical Review Letters · 1969 · 231 citations · 2 references

Concepts

Abstract

The position of a solute atom in a lattice can be detected by the nature of its x-ray fluorescence excitation during a diffraction process.Received 24 January 1969DOI:https://doi.org/10.1103/PhysRevLett.22.703©1969 American Physical Society

References

2