Concepedia

Publication | Closed Access

EBSD measurements of elastic strain fields in a GaN/sapphire structure

DOI

13

Citations

9

References

2005

Year

Junfeng Luo, Y. Ji, T. Zhong, Y. Q. Zhang, J.Z. Wang, Junjie Liu, Ning-Zhe Niu, Jun Han, Xiangying Guo, G. D. Shen
Microelectronics Reliability

References

YearCitations

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