A high-resolution x-ray fluorescence spectrometer for near-edge absorption studies

Abstract

A high-resolution fluorescence spectrometer using a Johann geometry in a backscattering arrangement was developed. The spectrometer, with a resolution of 0.3 eV at 6.5 keV, combined with an incident beam, with a resolution of 0.7 eV, form the basis of a high-resolution instrument for measuring x-ray absorption spectra. The advantages of the instrument are illustrated with the near-edge absorption spectrum of dysprosium nitrate.