Electron microscopy profiling of ion implantation damage in diamond: Dependence on fluence and annealing - Concepedia

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Electron microscopy profiling of ion implantation damage in diamond: Dependence on fluence and annealing

37

Citations

10

References

2014

Year

Emmanuel Nshingabigwi, T.E. Derry, S.R. Naidoo, J.H. Neethling, E.J. Olivier, J.H. O’Connell, C. M. Levitt

Diamond and Related Materials

Materials ScienceDiamond-like CarbonElectron Microscopy ProfilingIon ImplantationEngineeringElectron MicroscopyCrystalline DefectsMicroscopyApplied PhysicsIon Implantation DamageDefect FormationIon EmissionMicrostructure

References

	Year	Citations

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