Publication | Closed Access
Modeling of potentials and threshold voltage for symmetric doped double-gate MOSFETs
66
Citations
13
References
2007
Year
Device ModelingElectrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityDouble-gate MosfetsApplied PhysicsThreshold VoltagePower Semiconductor DevicePower ElectronicsMicroelectronicsSemiconductor Device
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