Electronics Letters · 1985 · 47 citations · 0 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor DevicesFiber OpticsOptical Communication SystemsOptical DetectorsPhotodetectorsPhotonic Integrated CircuitsSemiconductor DetectorsBondingCapacitanceIntegrated PhotodetectorsLeakageParasitic CapacitancePhotodetector SystemsWire Bonding
A novel GaInAs substrate illuminated photodetector structure is reported for the 1.0–1.7 μm wavelength range with capacitance as low as 0.02 pF, packaging stray capacitance below 0.02 pF, 97% quantum efficiency and subnanoampere leakage current. The device is rugged, epoxy-free, does not use an integral fibre pig-tail and wire bonding to the detector chip is not required.