Interdot coupling in a Si-based coupled double dot system for spin qubit gate

Seung‐Jun Shin, J. J. Lee, R. S. Chung, M. S. Kim, E. S. Park, Jihun Choi, N. S. Kim, Keun Hyung Park, S. D. Lee, N. Kim,

Applied Physics Letters · 2007 · 11 citations · 24 references

Concepts

Abstract

A Si-based coupled double dot has been studied for its application to two-qubit gate. The authors manipulated electron number of each dot by using its adjacent side gate and finally observed a honeycomb charge-stability pattern, demonstrating interdot capacitive coupling. From the honeycomb diagram the capacitance-related interdot coupling parameters were extracted. Moreover, a fine structure in a conductance trace near the triple point of the honeycomb, where the tunnel coupling is maximized, was measured for finite bias, and its dependence on the interdot coupling was attributed to the spin exchange between the two dots.

References

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