Publication | Closed Access
The Growth of Single Crystal of 3C-SiC on the Si Substrate by the MBE Method Using Multi Electron Beam Heating
26
Citations
10
References
1986
Year
Materials ScienceMaterials EngineeringSi SubstrateEpitaxial GrowthEngineeringSingle CrystalFilm ThicknessCrystal Growth TechnologyApplied PhysicsMbe MethodSemiconductor Device FabricationThin Film Process TechnologyThin FilmsSilicon On InsulatorMicroelectronicsMolecular Beam EpitaxyThin Film ProcessingCarbide
The growth of a single crystal of 3C-SiC on a Si substrate by the MBE method has been performed. A single-crystal film can be grown at a substrate temperature T sub =1150°C. This temperature is relatively low compared to that used in other methods. The diffused Si from a substrate plays an important part in the crystal growth of SiC, especially for a very thin film. The individual intensity of Si and C molecular beams ( J Si and J C ) and their intensity ratio J Si / J C should be selected with suitable values in accordance with the film thickness, considering the growth condition of the MBE method.
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