Solution processing of lanthanum zirconate films as single buffer layers for high I/sub c/ YBCO coated conductors

Abstract

Sol-gel processing of lanthanum zirconate (La/sub 2/Zr/sub 2/O/sub 7/ - referred to as LZO) buffer layers on biaxially textured nickel and Ni-3 at.% W alloy substrates using spin coating and a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. This coating and annealing process was repeated to get the desired buffer layer thickness. On these all-solution single buffer layer substrates, YBCO films were grown using pulsed laser deposition process. Critical current density about 2 MA/cm/sup 2/ at 77 K and self-field has been obtained on these samples. Continuous processing of these substrates and processing of high I/sub c/ YBCO films on them will be discussed.