Applied Optics · 1980 · 16 citations · 0 references
EngineeringMaterials EngineeringMaterials ScienceInstrumentationMaterials CharacterizationMetrologyCoordinate MeasurementCoordinate MetrologyCoordinate Reference SystemsCoordinate SystemsForm MetrologyOptical MetrologyAngular MetrologyOptical Form MetrologyThree-dimensional Measurement
A geometric system for universal use in specifying and measuring retroreflectance is described. This system has been developed by the Subcommittee on Retroreflectance of CIE Committee 2.3 on Properties of Materials and is to be considered for adoption as part of a recommended practice.