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A new approach to pH of point of zero charge measurement: crystal-face specificity by scanning force microscopy (SFM)

EngineeringCrystal-face SpecificityElectron MicroscopyMicroscopyCharge MeasurementScanning Probe MicroscopyApplied PhysicsScanning Force MicroscopyMicroanalysisElectron MicroscopeForce MicroscopyMedicineCrystallographyBiophysics