Japanese Journal of Applied Physics · 1984 · 72 citations · 8 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsDopingSemiconductor DefectsSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor PhysicsAnnealingAnnealing EffectsAnnealing Temperature EffectsDisordered SemiconductorsDoping BehaviorInterdiffusionSemiconductor DopingSilicon Annealing
Effect of Si-doping levels and annealing temperature on disordering of 150-Å AlAs/150-Å GaAs superlattices is studied. The doping level of 4×10 18 cm -3 cause disorder for 800°C, 2 h annealing, while the doping level of 1×10 18 cm -3 does not induce disorder on this annealing condition. A superlattice which is doped with 1×10 19 Si cm -3 disintegrates after 650°C, 2 h annealing and the diffusion coefficient of Al–Ga interdiffusion is estimated to be 3×10 -17 cm 2 s -1 . For 800°C, 2 h annealing the two undoped AlAs/GaAs layers adjacent to the doped region are disordered by Si diffusion.
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Disorder of an AlAs-GaAs superlattice by impurity diffusion
W. D. Laidig, N. Holonyak, M. D. Camras et al. · Applied Physics Letters · 1981 · 599 citations
Interdiffusion between GaAs and AlAs
L.L. Chang, A. Koma · Applied Physics Letters · 1976 · 206 citations
Disorder of an AlAs-GaAs superlattice by silicon implantation
J. J. Coleman, P.D. Dapkus, C. G. Kirkpatrick et al. · Applied Physics Letters · 1982 · 187 citations