Gamma-Induced Noise in CCDs

Abstract

Analysis and measurement of gamma-induced noise in CCDs (Charge Coupled Devices) provides an approach to study of energy deposition patterns in solids. The results should be of interest to those concerned with predicting the biological effects of ionizing radiation (e.g., chromosome" aberrations), as well as for those interested in semiconductor devices. The CCD appears to be a valuable tool in these areas of microdosimetry. The theory of energy deposition and distribution in CCD structures is developed, and test results are shown which indicate model validation. The model described permits the determination of the noise as a function of pixel size, chip material, and incident photon energy.