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Formation and Growth of Intermetallics in an Annealing-Twinned Ag-8Au-3Pd Wire Bonding Package During Reliability Tests
32
Citations
19
References
2012
Year
Materials ScienceMaterials EngineeringElectrical EngineeringHigh Temperature MaterialsWire BondingEngineeringAdvanced Packaging (Semiconductors)Al Pad PackagesSurface ScienceApplied PhysicsInterconnect (Integrated Circuits)Alloy DesignReliability TestsElectronic PackagingAlloy PhaseMicroelectronicsMicrostructureInnovative Annealing
Wire bonding on Al pad packages with an innovative annealing twinned Ag-8Au-3Pd alloy wire results in a sufficient interfacial intermetallic layer at the initial as-bonded stage, while its growth during the further temperature cycling test and pressure cooker test is very slow. Even after prolonged high-temperature storage at 150°C for 500 h, the thickness of its intermetallics is only around 1.7 μm. In contrast, a very thin CuAl <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> intermetallic layer appears at the interface of the Pd-coated Cu wire bonded package, and a thick layer of Au <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">8</sub> Al <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> intermetallic compounds forms in the Au wire package, which grows to a thickness of around 4.0 μm after high-temperature storage at 150 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">°</sup> C for 500 h. Energy dispersive X-ray spectrometry analyses indicate that AgAl <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> , Au <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">8</sub> Al <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> , and CuAl <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> are the main intermetallic phases formed in the packages bonded with Ag-8Au-3Pd, and Au and Pd-coated Cu wires, respectively. However, an additional Pd-containing Ag <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> Al layer found at the AgAl <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> /Al interface of Ag-8Au-3Pd wire bonded package can interrupt its intermetallic reaction, and the annealing twins can further slow the intermetallic growth.
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