In situ characterization of the nitridation of AIII–BV semiconductor surfaces by means of X-ray photoelectron spectroscopy - Concepedia

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In situ characterization of the nitridation of AIII–BV semiconductor surfaces by means of X-ray photoelectron spectroscopy

41

Citations

22

References

2001

Year

J.-D. Hecht, Frank Frost, Thomas Chassé, D. Hirsch, H. Neumann, A. Schindler, F. Bigl

Applied Surface Science

Materials ScienceSurface CharacterizationAiii–bv Semiconductor SurfacesEngineeringSurface AnalysisSurface ScienceApplied PhysicsX-ray Photoelectron SpectroscopyCompound SemiconductorSitu Characterization

References

	Year	Citations

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