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Piezoreflectance study of silicon carbon nitride nanorods
13
Citations
10
References
2000
Year
EngineeringTemperature DependenceLine Shape FitSemiconductor NanostructuresNanoelectronicsPiezoreflectance StudyQuantum MaterialsNanometrologyNanoscale ScienceQuasialigned Silicon CarbonNanomechanicsMaterials SciencePhysicsNanotechnologyThermal PhysicsSemiconductor MaterialSolid-state PhysicElectronic MaterialsNanomaterialsApplied PhysicsCondensed Matter PhysicsNano Electro Mechanical SystemPhonon
Detailed piezoreflectance (PzR) measurements of quasialigned silicon carbon nitride nanorods in the temperature range between 15 and 400 K were performed. The direct band-to-band transition energies Egd at various temperatures were determined accurately through line shape fit of the experimental PzR spectra. The temperature dependence of Egd is analyzed by the Varshni equation [Y. P. Varshni, Physica, (Amsterdam) 34, 149 (1967)] and an expression containing the Bose–Einstein occupation factor for phonons proposed by L. Viña, S. Logothetidis, and M. Cardona [Phys. Rev. B 30, 1979 (1984)]. The parameters that describe the temperature dependence of Egd are evaluated and discussed.
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