Publication | Closed Access
On determination of properties of ultrathin and very thin silicon oxide layers by FTIR and X - ray reflectivity
12
Citations
11
References
2008
Year
Materials ScienceSurface CharacterizationEngineeringOxide ElectronicsSurface ScienceApplied PhysicsSilicon On InsulatorRay ReflectivityThin SiliconThin Film Processing
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