Expert Systems with Applications · 2008 · 109 citations · 28 references
ComputingComputer ScienceManufacturing EngineeringComputer VisionMachine LearningMachine VisionDefect ClassificationDefect DetectionDigital Signal ProcessingIndustrial InspectionPattern RecognitionSignal ProcessingAutomated Inspection SystemsImage-based Defect ClassificationMachine Learning-based Defect DetectionReal-time Defect DetectionWavelet FeaturesWavelet TransformWavelet Transform Analysis
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Unsupervised texture segmentation using Gabor filters
Anil K. Jain, F. Farrokhnia · Pattern Recognition · 1991 · 2.1K citations