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Elastic constants and Poisson ratio in the system AlAs–GaAs
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1995
Year
Materials ScienceOptical MaterialsEngineeringPhysicsCrystalline DefectsOptical PropertiesApplied PhysicsCondensed Matter PhysicsSemiconductor MaterialPoisson RatioBrillouin ScatteringMolecular Beam EpitaxyEpitaxial GrowthCrystallographySlight BowingCompound Semiconductor
Near infrared Brillouin scattering was used to determine all three elastic constants, and hence Poisson’s ratio ν=C12/(C11+C12) of epitaxial AlxGa1−xAs layers on GaAs. The AlxGa1−xAs layers were grown by metalorganic chemical vapor deposition and molecular beam epitaxy. We found evidence for a slight bowing in all elastic constants versus Al composition x. The elastic constants of AlAs were determined to be C11=119.9 GPa±1.2 GPa, C12=57.5 GPa±1.3 GPa, and C44=56.6 GPa±0.7 GPa. From x-ray measurements and the Poisson ratio ν=0.324±0.004 the relaxed (cubic) AlAs lattice constant is found to be aAlAs=5.661 72 ű0.000 08 Å.
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