Applied Physics Letters · 2002 · 66 citations · 11 references
Natural SciencesMaterials ScienceMechanical EngineeringCeramic MaterialsMaterials CharacterizationThin FilmsFerroelectric CeramicsMechanical CharacterizationPiezoelectric MaterialsStrain MeasurementStrain SensorsThin Film StrainLead Zirconate TitanatePiezoelectric CharacterizationPiezoelectric CoefficientsPiezoelectric PropertiesPiezoelectric SensingPiezoelectric Thin FilmsSol-gel MaterialsThin-film Piezoelectrics
A method to simultaneously measure the longitudinal (d33) and transverse (d31) piezoelectric coefficients of a lead zirconate titanate (PZT) thin film was developed. This system was based on the pneumatic loading method but was modified to monitor the radial strain when a pressurized gas was introduced into the chamber. The results of the bulk piezoelectric material measured by this system coincided with that measured by both the Berlincourt method and the resonance method. The effective d33 and the real d31 of the PZT thin film fabricated by the sol-gel multiple coating method, and poled at 300 kV/cm were 125 and −60 pC/N, respectively. The real d33 estimated upon considering the constraints by the silicon substrate was 180 pC/N.
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Piezoelectric measurements with atomic force microscopy
J. A. Christman, R. R. Woolcott, A. I. Kingon et al. · Applied Physics Letters · 1998 · 284 citations