Depth selective Mössbauer-effect measurements by means of scattered electrons

Analysis of Thin Surface Layers by Fe-57 Mössbauer Backscattering Spectrometry

K. R. Swanson, J. J. Spijkerman · Journal of Applied Physics · 1970 · 148 citations

Natural Sciences, Chemistry, Materials Science +12

Method of analysis of thin surface layers by the Mössbauer effect

ZW. Bonchev, A. Jordanov, A. Minkova · Nuclear Instruments and Methods · 1969 · 128 citations

Natural Sciences, Chemistry, Materials Science +14

DETERMINATION OF SURFACE COMPOUND FORMATION BY BACKSCATTER MÖSSBAUER SPECTROSCOPY

J.H. Terrell, J. J. Spijkerman · Applied Physics Letters · 1968 · 81 citations

Natural Sciences, Materials Engineering, Materials Science +16

An analysis of backscatter Mössbauer spectra obtained with internal conversion electrons

R.A. Krakowski, Robert B. Miller · Nuclear Instruments and Methods · 1972 · 79 citations

Natural Sciences, Chemistry, Materials Science +6

Depth selection by means of scattered electrons: A method to determine electron line profiles

U. Bäverstam, Ch. Böhm, B. Ringström et al. · Nuclear Instruments and Methods · 1973 · 23 citations

Natural Sciences, Physics, Spectroscopy +1