Thermal scanning ac susceptometry method for high-<i>T</i> <i>c</i> superconductor studies

Abstract

Conventional ac susceptibility measurements and the conditions used in thermal analysis methods have been combined for normal-superconductor transition studies. Accordingly, during the ac susceptibility measurements, the Y-based sample is exposed to a temperature gradient. By controlling this gradient, the boundary between normal and superconducting region can be swept slowly at will across the specimen. The extended thermal scanning assures a high resolution to the new method. The observed fine details (even discontinuities) of the susceptibility spectra demonstrate its performance and basis.