Energy Dispersive Near Edge X-Ray Absorption Fine Structure in the Soft X-Ray Region: A New Technique to Investigate Surface Reactions

Abstract

A novel technique, energy dispersive near edge X-ray absorption fine structure (NEXAFS) spectroscopy, has been successfully developed by using a position sensitive electron analyzer and a new soft X-ray beamline constructed at the bending magnet in the Photon Factory. It was revealed that the NEXAFS spectra can be obtained even for submonolayer adsorbates with an accumulation period of ∼ 30 s. As the first application of the new technique, coverage dependence of C-K-edge NEXAFS spectra were recorded in situ for thiophene adsorption on Au(111).