Graphical Presentations of Systematic Trends of Atomic Oscillator Strengths Along iSOELECTRONIC Sequences and New Oscillator Strengths Derived by Interpolation

Abstract

Recently detected systematic trends of atomic oscillator strengths along isoelectronic sequences are utilized for the determination of new numerical data and for the evaluation of the reliability of existing material. All well-established systematic trends, which number about 100, are presented graphically. New oscillator strengths are interpolated from the graphs, mainly for the higher ions with wavelengths located principally in the vacuum ultraviolet, and are tabulated with their estimated uncertainties. The graphs are ordered according to isoelectronic sequences and are given with full grids to allow the addition of future data.