1/f noise measurements for characterizing multispot low-Ohmic contacts

Abstract

The patchiness of contacts can be determined from measurements of 1/f noise and contact resistance on a number of contacts of different diameters made by the same method. If a contact consists of k conducting spots with average radius a, k and a can be determined if the distance between the spot centers is at least 2.5 times the spot diameter. Using the developed multispot contact model, the results of the 1/f noise analysis are in good agreement with multispot parameters obtained from microscopic investigations.