Concepedia

Method of Measuring Spherical Aberration of an Electron Microscope Objective

Cecil E. Hall

Journal of Applied Physics · 1949 · 13 citations · 2 references

DOIFull text

Open access

Concepts

References

2

The Magnetic Electron Microscope Objective: Contour Phenomena and the Attainment of High Resolving Power

James Hillier, E. G. Ramberg · Journal of Applied Physics · 1947 · 142 citations

, , +12

Dark-Field Electron Microscopy. I. Studies of Crystalline Substances in Dark-Field

C. E. Hall · Journal of Applied Physics · 1948 · 46 citations

, , +11