X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO - Concepedia

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X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO

14

Citations

24

References

2005

Year

Christian Sternemann, J. A. Soininen, M. Volmer, A. Hohl, György Vankó, S. Streit, Metin Tolan

Journal of Physics and Chemistry of Solids

Materials ScienceEngineeringX-ray Raman ScatteringApplied PhysicsBulk Amorphous SioSemiconductor MaterialAmorphous SolidSi LiiSilicon On Insulator

References

	Year	Citations

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