A. Hohl - Concepedia

Author

A. Hohl

Technical University of Darmstadt

Also Known As

A Hohl, A. Hohl, Achim Hohl, Hohl, Achim

Publications

419

Citations

H-Index

Concepts

All Affiliations

Technical University of Darmstadt TU Dortmund University University of Helsinki Helsinki Institute of Physics University of Washington

About

A. Hohl is an author at Technical University of Darmstadt specializing in materials science, applied physics, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	395
2	Applied Physics	6	6	395
3	Materials Science	6	6	393
4	Chemistry	2	2	289
5	Natural Sciences	1	1	15

A. Hohl

Publications

408

Citations

H-Index

Page 1

	Year	Citations
An interface clusters mixture model for the structure of amorphous silicon monoxide (SiO) A. Hohl, Thomas Wieder, Peter A. van Aken, Journal of Non-Crystalline Solids Materials ScienceCluster ScienceEngineeringInterface ClustersSurface Science	2003	274
Raman scattering of acoustical modes of silicon nanoparticles embedded in silica matrix Mile Ivanda, A. Hohl, M. Montagna, Journal of Raman Spectroscopy Optical MaterialsGlass MatrixEngineeringAcoustic MetamaterialSurface-enhanced Raman Scattering	2006	37
Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering Omid M. Feroughi, Christian Sternemann, Christoph J. Sahle, Applied Physics Letters Materials ScienceNanoscale ScienceEngineeringCrystalline DefectsNanomaterials	2010	34
Phase separation and nanocrystal formation in GeO Christoph J. Sahle, Christian Sternemann, Heiko Conrad, Applied Physics Letters Materials ScienceEngineeringCrystalline DefectsNanomaterialsNanotechnology	2009	21
Suboxide interface in disproportionating<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>a</mml:mi></mml:math>-SiO studied by x-ray Raman scattering Arto Sakko, Christian Sternemann, Christoph J. Sahle, Physical Review B EngineeringAmorphous Silicon MonoxideComputational ChemistryChemistrySilicon On Insulator	2010	15
X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO Christian Sternemann, J. A. Soininen, M. Volmer, Journal of Physics and Chemistry of Solids Materials ScienceEngineeringX-ray Raman ScatteringApplied PhysicsBulk Amorphous Sio	2005	14
Temperature-induced obliteration of sub-oxide interfaces in amorphous GeO A. Schacht, Christian Sternemann, A. Hohl, Journal of Non-Crystalline Solids Materials ScienceOxide ElectronicsAmorphous SolidTemperature-induced ObliterationInterface Property	2009	13

Page 1