EXAFS and X-ray diffraction of RM2X2 compounds (R = rare earths, M> = transition metal, X = Si, Ge)

C. Godart, C. Ammarguellat, M. F. Ravet, N. Wetta, Claude Lévy‐Clément, H. Noël, G. Krill

Solid State Communications · 1986 · 20 citations · 4 references

Concepts

References

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