Japanese Journal of Applied Physics · 2012 · 20 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceSemiconductor DevicesSemiconductor MaterialsThin FilmsEpitaxial GrowthSemiconductor PhysicsSemiconductor SurfacesSemiconductor Thin FilmsThin-film DepositionThin-film MaterialsDeposition RateDeposition Rate EffectsEpitaxial Film GrowthEpitaxial Film MorphologyEpitaxial Thin FilmsEpitaxial Thin-film GrowthMolecular Beam EpitaxyReactive Deposition
100-nm-thick BaSi 2 epitaxial films were grown on Si(111) substrates by a two-step growth method including reactive deposition epitaxy (RDE) and molecular beam epitaxy (MBE). The Ba deposition rate and duration were varied from 0.25 to 1.0 nm/min and from 5 to 120 min during RDE, respectively. Plan-view transmission electron micrographs indicated that the grain size in the MBE-grown BaSi 2 was significantly dependent on the RDE growth conditions and was varied from approximately 0.2 to more than 4 µm.
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Katsuaki Toh, Takanobu Saito, Takashi Suemasu · Japanese Journal of Applied Physics · 2011 · 154 citations
Natural Sciences, Materials Engineering, Materials Science +17
Masakazu Baba, Katsuaki Toh, Kaoru Toko et al. · Journal of Crystal Growth · 2012 · 147 citations