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Reconstruction of thermal boundary resistance and intrinsic thermal conductivity of SiO 2 -GaN-sapphire structure and temperature dependence

Sio 2Wide-bandgap SemiconductorEngineeringPhysicsApplied PhysicsAluminum Gallium NitrideIntrinsic Thermal ConductivityGan Power DeviceGallium OxideThermal Boundary ResistanceThermal Engineering