Applied Physics Letters · 2006 · 49 citations · 23 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsSurface ScienceSemiconductor InterfacesSemiconductor SurfacesSurface CharacterizationSurface OxidationSurface PhysicsWide-bandgap SemiconductorsBand BendingCoverageGallium Nitride (Gan) MaterialsGallium OxideSurface Band BendingSurface Oxidation MechanismsThin Oxide FilmsWide-bandgap Oxides
A trend of increased near-surface valence band maximum band bending with increasing O∕Ga relative fraction was observed, extrapolating to 2.7eV±0.1eV for pristine GaN surfaces (0% O 1s peak area). This trend of apparent oxide overlayer coverage affecting the band bending linearly could lead to better understanding and characterization of oxidized GaN surfaces to control band bending for sensors or other devices.
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Semiconductor ultraviolet detectors
Manijeh Razeghi, Antoni Rogalski · Journal of Applied Physics · 1996 · 1.5K citations